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Journal Articles Microelectronics Reliability Year : 2013

Modeling of the diffusion phenomenon in a lithium-ion cell using frequency or time domain identification

L. Gagneur
  • Function : Author
L. Driemeyer-Franco
  • Function : Author
C. Forgez
  • Function : Author
Université de Technologie de Compiègne
Guy Friedrich
Roberval
CV

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Engineering Sciences [physics] Electric power

GUY FRIEDRICH  : Connect in order to contact the contributor

https://hal.utc.fr/hal-01970016

Submitted on : Friday, January 4, 2019-4:45:23 PM

Last modification on : Thursday, December 15, 2022-12:58:33 PM

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hal-01970016 , version 1 (04-01-2019)

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  • HAL Id : hal-01970016 , version 1

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L. Gagneur, L. Driemeyer-Franco, C. Forgez, Guy Friedrich. Modeling of the diffusion phenomenon in a lithium-ion cell using frequency or time domain identification. Microelectronics Reliability, 2013, 53 (6), pp.784-796. ⟨hal-01970016⟩

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