Modeling of the diffusion phenomenon in a lithium-ion cell using frequency or time domain identification - Archive ouverte HAL Access content directly
Journal Articles Microelectronics Reliability Year : 2013

Modeling of the diffusion phenomenon in a lithium-ion cell using frequency or time domain identification

, , (1) , (2)
1
2
L. Gagneur
  • Function : Author
L. Driemeyer-Franco
  • Function : Author
Guy Friedrich
Not file

Dates and versions

hal-01970016 , version 1 (04-01-2019)

Identifiers

  • HAL Id : hal-01970016 , version 1

Cite

L. Gagneur, L. Driemeyer-Franco, C. Forgez, Guy Friedrich. Modeling of the diffusion phenomenon in a lithium-ion cell using frequency or time domain identification. Microelectronics Reliability, 2013, 53 (6), pp.784-796. ⟨hal-01970016⟩
25 View
0 Download

Share

Gmail Facebook Twitter LinkedIn More