Journal Articles
Microelectronics Reliability
Year : 2013
GUY FRIEDRICH : Connect in order to contact the contributor
https://hal.utc.fr/hal-01970016
Submitted on : Friday, January 4, 2019-4:45:23 PM
Last modification on : Wednesday, April 12, 2023-9:49:32 AM
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- HAL Id : hal-01970016 , version 1
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L. Gagneur, L. Driemeyer-Franco, C. Forgez, Guy Friedrich. Modeling of the diffusion phenomenon in a lithium-ion cell using frequency or time domain identification. Microelectronics Reliability, 2013, 53 (6), pp.784-796. ⟨hal-01970016⟩
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